发明名称 Modified Gold-Tin System With Increased Melting Temperature for Wafer Bonding
摘要 A semiconductor structure and a bonding method are disclosed that includes a device wafer, a substrate wafer, and a metal bonding system between the device wafer and the substrate wafer. The metal bonding system includes gold, tin, and nickel, and includes at least one discrete layer of gold and tin that is at least about 88 percent gold by weight.
申请公布号 US2008073665(A1) 申请公布日期 2008.03.27
申请号 US20060534317 申请日期 2006.09.22
申请人 SLATER DAVID B;EDMOND JOHN A;KONG HUA-SHUANG 发明人 SLATER DAVID B.;EDMOND JOHN A.;KONG HUA-SHUANG
分类号 H01L21/58;H01L33/00 主分类号 H01L21/58
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