发明名称 SEMICONDUCTOR DEVICE STRUCTURE AND ITS MANUFACTURE METHOD
摘要 A semiconductor device structure is provided to vary the physical and electrical characteristics of a semiconductor layer by additionally applying compressive stress or tensile stress from the outside. A bipolar semiconductor device of a heterojunction structure includes an emitter(211), an intrinsic base(212), a collector(213) and an insulation layer sidewall. A base for applying stress is selectively and epitaxially grown to apply local stress to the semiconductor device. The base can have a (311) slope(218) by a self-aligned epitaxial growth method. The semiconductor device structure can include an insulation layer(215) for applying stress that additionally applies local stress to the semiconductor device.
申请公布号 KR100817403(B1) 申请公布日期 2008.03.27
申请号 KR20060114454 申请日期 2006.11.20
申请人 INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY 发明人 SHIM, KYU HWAN;CHOI, SANG SIG;CHOI, A RAM
分类号 H01L29/737 主分类号 H01L29/737
代理机构 代理人
主权项
地址