发明名称 |
SEMICONDUCTOR DEVICE STRUCTURE AND ITS MANUFACTURE METHOD |
摘要 |
A semiconductor device structure is provided to vary the physical and electrical characteristics of a semiconductor layer by additionally applying compressive stress or tensile stress from the outside. A bipolar semiconductor device of a heterojunction structure includes an emitter(211), an intrinsic base(212), a collector(213) and an insulation layer sidewall. A base for applying stress is selectively and epitaxially grown to apply local stress to the semiconductor device. The base can have a (311) slope(218) by a self-aligned epitaxial growth method. The semiconductor device structure can include an insulation layer(215) for applying stress that additionally applies local stress to the semiconductor device. |
申请公布号 |
KR100817403(B1) |
申请公布日期 |
2008.03.27 |
申请号 |
KR20060114454 |
申请日期 |
2006.11.20 |
申请人 |
INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY |
发明人 |
SHIM, KYU HWAN;CHOI, SANG SIG;CHOI, A RAM |
分类号 |
H01L29/737 |
主分类号 |
H01L29/737 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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