发明名称 INTERLOCK SYSTEM OF SEMICONDUCTOR PROCESSING EQUIPMENT
摘要 An interlock system of a semiconductor processing apparatus is provided to detect rapidly causes of an accident by monitoring input and output voltages of each of units in real time. A semiconductor processing apparatus(110) includes a plurality of power supply units. A real-time power monitoring unit(120) monitors input and output voltages of the power supply units in real time and outputs an abnormal state signal according to a monitored result. An interlock signal generation unit(140) generates an interlock signal in response to the abnormal state signal. A control unit(150) outputs a control signal in response to the interlock signal to control the semiconductor processing apparatus. A display unit(160) displays the input and output voltages of the power supply units received from the real-time power monitoring unit.
申请公布号 KR20080026831(A) 申请公布日期 2008.03.26
申请号 KR20060091893 申请日期 2006.09.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JAE PIL
分类号 H01L21/02;H01L21/66 主分类号 H01L21/02
代理机构 代理人
主权项
地址