发明名称 |
INTERLOCK SYSTEM OF SEMICONDUCTOR PROCESSING EQUIPMENT |
摘要 |
An interlock system of a semiconductor processing apparatus is provided to detect rapidly causes of an accident by monitoring input and output voltages of each of units in real time. A semiconductor processing apparatus(110) includes a plurality of power supply units. A real-time power monitoring unit(120) monitors input and output voltages of the power supply units in real time and outputs an abnormal state signal according to a monitored result. An interlock signal generation unit(140) generates an interlock signal in response to the abnormal state signal. A control unit(150) outputs a control signal in response to the interlock signal to control the semiconductor processing apparatus. A display unit(160) displays the input and output voltages of the power supply units received from the real-time power monitoring unit.
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申请公布号 |
KR20080026831(A) |
申请公布日期 |
2008.03.26 |
申请号 |
KR20060091893 |
申请日期 |
2006.09.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE PIL |
分类号 |
H01L21/02;H01L21/66 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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