发明名称
摘要 PROBLEM TO BE SOLVED: To provide a device and method for plasma treatment by which the occurrence of failures can be prevented by making a plate-shaped substrate to be held appropriately on a substrate placing section. SOLUTION: In the method for plasma treatment, a silicon wafer is plasma- treated by placing the wafer on a placing surface on an insulating layer 5 formed on a lower electrode 3 in a processing chamber 2. Before plasma is generated between the lower electrode 3 and an upper electrode 4, the silicon wafer is held by the insulating layer 5 by vacuum suction by driving a vacuum suction pump 12 and, after the plasma is generated, the wafer is held by the lower electrode 3 by electrostatic attraction by impressing a DC voltage upon the electrode 3 from a DC power source section 18 for electrostatic attraction. Consequently, the silicon wafer can be held appropriately by the lower electrode 3 and the occurrence of abnormal discharge or defective cooling caused by defective adhesion can be prevented. COPYRIGHT: (C)2004,JPO
申请公布号 JP4066887(B2) 申请公布日期 2008.03.26
申请号 JP20030157933 申请日期 2003.06.03
申请人 发明人
分类号 H01L21/3065;H01L21/683 主分类号 H01L21/3065
代理机构 代理人
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