Method for detecting a defect in a microarray,申请号KR20020065521-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Method for detecting a defect in a microarray
摘要
申请公布号	KR100817046(B1)	申请公布日期	2008.03.26
申请号	KR20020065521	申请日期	2002.10.25
申请人		发明人
分类号	C12Q1/00	主分类号	C12Q1/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

IMAGE PROCESSOR WITH EVALUATION LAYER IMPLEMENTING SOFTWARE AND HARDWARE ALGORITHMS OF DIFFERENT PRECISION

CONVERGENT PROCESSES FOR PREPARING MACROLIDE ANTIBACTERIAL AGENTS

REMOTE UNIT FOR COMMUNICATING WITH BASE STATIONS AND TERMINAL DEVICES

COMBINED POWER SUPPLY AND INPUT/OUTPUT SYSTEM WITH BOOST CAPABILITY

DIFFERENTIAL ENGINE CONTROLLED ROTATIONAL POWER TRANSMISSION APPARATUS AND SYSTEMS USING THE SAME

TURBINE TRACK ASSEMBLY, CORRESPONDING GAS TURBINE ENGINE AND METHOD

TRANSPARENT AUTOSTEREOSCOPIC DISPLAY

TETRAHYDROPYRROLOTHIAZINE COMPOUNDS

MULTI-LINGUAL BUSINESS INDICIA CURATION AND TRANSLITERATION SYNTHESIS

INSULATING CONTAINER AND METHODS OF MAKING AN INSULATING CONTAINER

SHARED DATA COMMUNICATION BANDWIDTHS AMONG MOBILE DEVICES

METATHESIS CATALYSTS AND REACTIONS USING THE CATALYSTS

METHODS AND SYSTEMS FOR FACILITATING A GAME WHICH ALLOWS A PLAYER TO SELECT AVAILABLE WAGERING OPPORTUNITIES

NANOLAMINATE COATINGS

NICKEL CHROMIUM NANOLAMINATE COATING HAVING HIGH HARDNESS

MODULAR DATA CENTER COOLING

ACTIVE OPTICAL STYLUS AND SENSOR

COMPOUNDS AND METHODS RELATING TO TESTING FOR LYSOSOMAL STORAGE DISORDERS

NOVEL PI POLYAMIDE