发明名称 Controlled breakdown phase change memory device
摘要 A phase change memory material may be deposited over an electrode in a pore through an insulator. The adherence of the memory material to the insulator may be improved by using a glue layer. At the same time, a breakdown layer may be formed in the pore between the memory material and electrode.
申请公布号 US7348268(B2) 申请公布日期 2008.03.25
申请号 US20040939237 申请日期 2004.09.10
申请人 INTEL CORPORATION 发明人 DENNISON CHARLES H.
分类号 H01L21/44 主分类号 H01L21/44
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