发明名称 |
POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of forming a resist pattern in which line edge roughness (LER) is reduced and a resist pattern forming method. <P>SOLUTION: The positive resist composition comprises a resin component (A) of which the alkali solubility increases under the action of an acid and an acid generator component (B) which generates an acid upon exposure to light, wherein the resin component (A) comprises a unit having a bridged alicyclic group in a side chain through an acetal bond and a unit having a tertiary ester type acid-dissociable group. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008065282(A) |
申请公布日期 |
2008.03.21 |
申请号 |
JP20060246131 |
申请日期 |
2006.09.11 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
KINOSHITA YOHEI;IWAI TAKESHI;OGATA TOSHIYUKI |
分类号 |
G03F7/039;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|