发明名称 CONFOCAL ELECTRIC LIGHT EMISSION SPECTRAL MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a confocal electric light emission spectral microscope capable of simultaneously obtaining a spectrum for an electric light emitting element and a mechanical external structure for the element and also capable of obtaining an electric light emission video with high resolution. SOLUTION: The confocal electric light emission spectral microscope includes: a support part on which an object containing a substance that can emit light is mounted; a power source supply device for applying a current to induce electric light emission in the object mounted on the support part; a confocal lens disposed above the support part and used to receive light emitted from the object; a detecting part disposed above the confocal lens and used to obtain energy distribution relative to light emitted from the object; and a pin hole disposed between the confocal lens and the detecting part and used to allow the passage of a light emission signal relative to a confocal point formed on the target face of the object. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008065331(A) 申请公布日期 2008.03.21
申请号 JP20070230529 申请日期 2007.09.05
申请人 SAMSUNG ELECTRO-MECHANICS CO LTD 发明人 HONG SANG SU;KIM BAE KYUN;PARK JUNE SIK;ONUSHKIN GRIGORY
分类号 G02B21/00;G01N21/66;G02B21/06 主分类号 G02B21/00
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