发明名称 |
CONFOCAL ELECTRIC LIGHT EMISSION SPECTRAL MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a confocal electric light emission spectral microscope capable of simultaneously obtaining a spectrum for an electric light emitting element and a mechanical external structure for the element and also capable of obtaining an electric light emission video with high resolution. SOLUTION: The confocal electric light emission spectral microscope includes: a support part on which an object containing a substance that can emit light is mounted; a power source supply device for applying a current to induce electric light emission in the object mounted on the support part; a confocal lens disposed above the support part and used to receive light emitted from the object; a detecting part disposed above the confocal lens and used to obtain energy distribution relative to light emitted from the object; and a pin hole disposed between the confocal lens and the detecting part and used to allow the passage of a light emission signal relative to a confocal point formed on the target face of the object. COPYRIGHT: (C)2008,JPO&INPIT
|
申请公布号 |
JP2008065331(A) |
申请公布日期 |
2008.03.21 |
申请号 |
JP20070230529 |
申请日期 |
2007.09.05 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO LTD |
发明人 |
HONG SANG SU;KIM BAE KYUN;PARK JUNE SIK;ONUSHKIN GRIGORY |
分类号 |
G02B21/00;G01N21/66;G02B21/06 |
主分类号 |
G02B21/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|