发明名称 DEVICE TESTING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a device testing equipment capable of constantly maintaining a contact pressure for a device as a test object at an optimal value. SOLUTION: The device testing equipment has a contact head for holding the device as a test object and causing the device to contact with a socket of a testing means, and a contact-position controlling means for controlling the lowering of the device to the contact position level of the socket includes a torque instruction means for inputting a proper pressure set value of the device for the socket, calculating the instruction value of the proper torque to generate the proper pressure, and transferring the instruction value to the contact position controlling means. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008064478(A) 申请公布日期 2008.03.21
申请号 JP20060239672 申请日期 2006.09.05
申请人 YOKOGAWA ELECTRIC CORP 发明人 MATSUSHITA MAKI
分类号 G01R31/26 主分类号 G01R31/26
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