发明名称 SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a substrate treatment method and a substrate treatment apparatus capable of inhibiting the formation of an insulating layer on a substrate surface where the insulating layer is not needed and selectively forming the layer in a non-through hole when forming the insulating layer in the non-through hole formed at the substrate by an electrodeposition method, and to provide a semiconductor device. SOLUTION: An excessive insulating layer 15 formed on the surface of a semiconductor substrate 10 when forming the non-through hole 11 on the substrate 10 and forming the insulating layer 15 in the hole 11 by the electrodeposition method is removed by friction by a friction means 17, thereby selectively forming the insulating layer 15 in the non-through hole 11. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008066601(A) 申请公布日期 2008.03.21
申请号 JP20060244736 申请日期 2006.09.08
申请人 EBARA CORP 发明人 SUZAKI AKIRA;NAKADA TSUTOMU
分类号 H01L21/312;H01L21/3205;H01L23/52 主分类号 H01L21/312
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