发明名称 |
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate treatment method and a substrate treatment apparatus capable of inhibiting the formation of an insulating layer on a substrate surface where the insulating layer is not needed and selectively forming the layer in a non-through hole when forming the insulating layer in the non-through hole formed at the substrate by an electrodeposition method, and to provide a semiconductor device. SOLUTION: An excessive insulating layer 15 formed on the surface of a semiconductor substrate 10 when forming the non-through hole 11 on the substrate 10 and forming the insulating layer 15 in the hole 11 by the electrodeposition method is removed by friction by a friction means 17, thereby selectively forming the insulating layer 15 in the non-through hole 11. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008066601(A) |
申请公布日期 |
2008.03.21 |
申请号 |
JP20060244736 |
申请日期 |
2006.09.08 |
申请人 |
EBARA CORP |
发明人 |
SUZAKI AKIRA;NAKADA TSUTOMU |
分类号 |
H01L21/312;H01L21/3205;H01L23/52 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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