发明名称 DETERIORATION DIAGNOSIS METHOD OF ELECTRICAL APPARATUS INSULATION MATERIAL
摘要 PROBLEM TO BE SOLVED: To collect a sample easily without damaging the appearance of an electrical apparatus. SOLUTION: Each integrated weight loss curve of a primary weight reduction quantity and a secondary weight reduction quantity of an integrated curve of a thermal weight reduction curve at a weight changing time of an insulation material acquired from TG-DTA is converted into a differential value to acquire a differential peak, and differential multiple peak dividing processing is performed, and a secondary weight reduction peak area value is divided by a primary weight reduction peak area value, to thereby calculate a weight reduction ratio, and correlation with a weight reduction rate acquired by a conventional method is taken by using the weight reduction ratio as an index value of TG-DTA, to thereby create a master curve, and the master curve is compared with a measurement/analysis result by TG-DTA of the sample collected from the electrical apparatus. Then, the insulation material 2 for sample collection is provided at an apparatus molding time on a measuring object portion near a primary conductor 1 by TG-DTA of the electrical apparatus. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008064580(A) 申请公布日期 2008.03.21
申请号 JP20060242226 申请日期 2006.09.07
申请人 MEIDENSHA CORP 发明人 YOSHIOKA YASUHIRO
分类号 G01N25/20;G01N5/04;G01N17/00 主分类号 G01N25/20
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