摘要 |
PROBLEM TO BE SOLVED: To provide a digital/analog conversion apparatus capable of achieving a high resolution inexpensively, and to provide a DC testing device using the same. SOLUTION: The digital/analog conversion apparatus includes: a digital signal generation unit 10 to which digital data of n+1 bits are input, and which alternately outputs based on a synchronizing signal first digital data of high-order (n) bits of the input digital data and second digital data obtained based on the first digital data in accordance with digital data if a least significant bit of the input digital data; and a DAC 12 of n-bit resolution which converts the first digital data of (n) bits or the second digital data alternately output from the digital signal generation unit 10 into an analog signal. COPYRIGHT: (C)2008,JPO&INPIT
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