| 摘要 |
PROBLEM TO BE SOLVED: To provide a delay measuring circuit capable of readily inspecting delay failures which has become more likely to occur, with the increase in speed and in microfabrication of semiconductor integrated circuit LSIs. SOLUTION: A scan circuit includes a delay line, provided with a delay element 24 and a delay-mode selector 25, and a mode during test is set to a delay measuring mode, by setting "1" to a delay-mode enable DE of the selector 25. The state of the delay line is acquired, by inputting data transition to the delay line and by capturing the value of the delay line into a register by a capture clock. A scan out terminal delay value is calculated by shifting this piece of data, and the delay in the operating frequency is measured. COPYRIGHT: (C)2008,JPO&INPIT
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