发明名称 SUBSTRATE CARRYING DEVICE, AND SUBSTRATE INSPECTION SYSTEM USING IT
摘要 PROBLEM TO BE SOLVED: To surely suck and hold even a substrate where warpage or twist has occurred while keeping the condition of a substrate surface well, in a substrate carrying device and a substrate inspection system using it. SOLUTION: This substrate carrying device and this substrate inspection system are each provided with: a substrate lifting stage 9 lifting a glass substrate 7; a carrier mechanism 8 arranged movably along the substrate lifting state 9, and having a suction part 16 sucking and holding the glass substrate 7 on the substrate back surface 7b side of any of side edge parts of the glass substrate 7; and a suction assist part 18 having a pressing roller 19 pressing the glass substrate 7 mounted on the suction part 16 from the substrate surface 7a side against the suction part 16, and an actuator 30 moving the pressing roller 19 forward/backward form the side in the carrying direction of the glass substrate 7. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008063020(A) 申请公布日期 2008.03.21
申请号 JP20060239397 申请日期 2006.09.04
申请人 OLYMPUS CORP 发明人 KATAOKA YOUSUKE
分类号 B65G49/06;G01N21/84;G01N21/88;H01L21/677 主分类号 B65G49/06
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