发明名称 LIQUID PROCESSING APPARATUS AND LIQUID PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a liquid processing apparatus and a liquid processing method for surely preventing adhesion of particles to a substrate when it is dried, and also preventing generation a water mark without increase in the initial cost and running cost and without increase in foot print. SOLUTION: The liquid processing apparatus 100 conducts a liquid process to a substrate while the processing liquid is supplied to a wafer W, and conducts thereafter the drying process. This liquid processing apparatus 100 includes a substrate holder 2 for horizontally holding the wafer W to be rotatable, a rotating mechanism 3 for rotating the substrate holder 2, a processing liquid supplying mechanism 85 for supplying the processing liquid to the wafer W, and a drying gas supplying mechanism 10 for supplying the drying gas at least to the circumferential edge at the upper part of the wafer W during the process for drying the wafer W. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008060203(A) 申请公布日期 2008.03.13
申请号 JP20060233250 申请日期 2006.08.30
申请人 TOKYO ELECTRON LTD 发明人 ITO KIKO;NANBA HIROMITSU
分类号 H01L21/304;B08B3/02 主分类号 H01L21/304
代理机构 代理人
主权项
地址