发明名称 Flexible via design to improve reliability
摘要 An integrated circuit includes a metallization layer, a first metal line in the metallization layer, and a first via electrically connected to the first metal line. The first via has a first via width and a first pitch from a nearest via on a neighboring metal line, wherein the first pitch is a minimum pitch of all vias on the metallization layer. The integrated circuit further includes a second metal line in the metallization layer, and a second via electrically connected to the second metal line. The second via has a second pitch greater than about 1.1 times the first pitch. The second via has a second via width greater than the first via width but no more than about 1.4 times the first via width.
申请公布号 US2008061441(A1) 申请公布日期 2008.03.13
申请号 US20060518333 申请日期 2006.09.07
申请人 LIU CHUNG-SHI 发明人 LIU CHUNG-SHI
分类号 H01L23/48 主分类号 H01L23/48
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