发明名称 |
PROBE PIN AND TEST SOCKET INCLUDING THE SAME |
摘要 |
A probe pin and test socket having the same are provided to improve productivity and to easily separate an upper section of the probe pin from a lower section thereof. A probe pin is comprised of a barrel(10) having a guide groove or slot(12), an elastic member(20) inserted into the barrel, a protrusion strip(32), and a plunger(30). The barrel has a barrel shape having one closed end. The guide groove or slot is provided on a lateral side of the barrel. The plunger is coupled to an upper section of the elastic member and a part thereof is inserted into the barrel. The protrusion strip is inserted into the guide groove or slot to be placed in the plunger. The barrel further includes a connection groove or slot connected to the guide groove or slot from another side of the barrel.
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申请公布号 |
KR100813280(B1) |
申请公布日期 |
2008.03.13 |
申请号 |
KR20060107162 |
申请日期 |
2006.11.01 |
申请人 |
OKINS ELECTRONICS CO., LTD. |
发明人 |
JUN, JIN GUK;PARK, SUNG KYU;SHIM, JAE WEON |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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