发明名称 PROBE PIN AND TEST SOCKET INCLUDING THE SAME
摘要 A probe pin and test socket having the same are provided to improve productivity and to easily separate an upper section of the probe pin from a lower section thereof. A probe pin is comprised of a barrel(10) having a guide groove or slot(12), an elastic member(20) inserted into the barrel, a protrusion strip(32), and a plunger(30). The barrel has a barrel shape having one closed end. The guide groove or slot is provided on a lateral side of the barrel. The plunger is coupled to an upper section of the elastic member and a part thereof is inserted into the barrel. The protrusion strip is inserted into the guide groove or slot to be placed in the plunger. The barrel further includes a connection groove or slot connected to the guide groove or slot from another side of the barrel.
申请公布号 KR100813280(B1) 申请公布日期 2008.03.13
申请号 KR20060107162 申请日期 2006.11.01
申请人 OKINS ELECTRONICS CO., LTD. 发明人 JUN, JIN GUK;PARK, SUNG KYU;SHIM, JAE WEON
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址