发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device furnished with a delay locked circuit easily correcting a duty ratio when outputting a delay locked clock of a semiconductor memory device. <P>SOLUTION: The semiconductor memory device includes a delay locked circuit, a duty cycle correction circuit, and a clock synchronization circuit. The delay locked circuit outputs a delay locked clock by delaying a system clock by a predetermined time. The duty cycle correction circuit outputs a first clock by correcting a duty cycle of the delay locked clock, wherein the proportion of high to low level periods of the delay locked clock is controlled according to a time difference between a second edge of the first clock and that of a second clock derived from the first clock. The clock synchronization circuit synchronizes a first edge of the first clock with that of the second clock. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008059741(A) 申请公布日期 2008.03.13
申请号 JP20070220652 申请日期 2007.08.28
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE HYUN-WOO;YUN WON-JOO
分类号 G11C11/4076;G06F1/06;G11C11/407;H03K5/04;H03K5/13;H03K5/26 主分类号 G11C11/4076
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