发明名称 |
INSPECTION DEVICE AND INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device and an inspection method capable of detecting the state of a solder paste inside. SOLUTION: An illumination device 5 irradiates a substrate on which solder paste is applied with infrared light having a prescribed intensity. An imaging device 6 images the substrate irradiated with the infrared light. A main control part 95 of a control device 9 can detect a sectional shape of the solder paste based on an intensity distribution of the infrared light reflected by the substrate from image data of a taken image by the imaging device 6. Since reflected light from the solder paste surface can be removed by a removal part 95c, the sectional shape of the solder can be detected more accurately. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2008058277(A) |
申请公布日期 |
2008.03.13 |
申请号 |
JP20060239036 |
申请日期 |
2006.09.04 |
申请人 |
I-PULSE CO LTD |
发明人 |
TSUNODA YOSHIHISA;NAKAJIMA TSUTOMU |
分类号 |
G01B11/24;B23K1/00;B23K101/42;G01N21/956;G01N33/20;H05K3/34 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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