发明名称 INSPECTION DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inspection device and an inspection method capable of detecting the state of a solder paste inside. SOLUTION: An illumination device 5 irradiates a substrate on which solder paste is applied with infrared light having a prescribed intensity. An imaging device 6 images the substrate irradiated with the infrared light. A main control part 95 of a control device 9 can detect a sectional shape of the solder paste based on an intensity distribution of the infrared light reflected by the substrate from image data of a taken image by the imaging device 6. Since reflected light from the solder paste surface can be removed by a removal part 95c, the sectional shape of the solder can be detected more accurately. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008058277(A) 申请公布日期 2008.03.13
申请号 JP20060239036 申请日期 2006.09.04
申请人 I-PULSE CO LTD 发明人 TSUNODA YOSHIHISA;NAKAJIMA TSUTOMU
分类号 G01B11/24;B23K1/00;B23K101/42;G01N21/956;G01N33/20;H05K3/34 主分类号 G01B11/24
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