发明名称 ION TRAP MASS SPECTROMETRY
摘要 PROBLEM TO BE SOLVED: To provide an ion trap mass spectrometry which secures sufficiently an objective ion, and optimizes MS/MS measurement. SOLUTION: The ion trap mass spectrometry of the present invention uses a mass spectrometer provided with: an ion source for ionizing a sample; an ion trapping part for trapping ions generated in the ion source; a main high-frequency electric power source for impressing a main high-frequency voltage onto the ion trapping part; an auxiliary high-frequency electric power source for impressing an auxiliary high-frequency voltage thereto; and a detecting part for detecting the ions discharged from the ion trap. The spectrometry repeats alternately a capturing step of discharging the unnecessary ions while trapping the ions in the ion trapping part to capture the objective ion in the ion trapping part, and an unnecessary ion discharge step of discharging the unnecessary ions remaining in the ion trapping part and of making the objective ion remain in the ion trapping part. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008058281(A) 申请公布日期 2008.03.13
申请号 JP20060239070 申请日期 2006.09.04
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YASUDA HIROYUKI;NAGAI SHINJI;NISHIDA TETSUYA
分类号 G01N27/62;H01J49/42 主分类号 G01N27/62
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