发明名称 FLAW INSPECTION METHOD AND FLAW INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To accurately set a Cell Area while automating the setting of the Cell Area set by the Recipe of a flaw inspection device. SOLUTION: The discrimination of a Cell Mat Area set heretofore by clicking a mouse by a person is performed by scanning an Image using the difference between the distribution features of a Gray Levels of the Cell Mat Area and a non-Cell Mat Area to divide the Cell Mat Area and the non-Cell Mat Area from the scanning result. Concretely, the threshold value becoming a standard for discriminating the start and finish points of a Cell Mat is calculated based on an Area where only a Memory Cell is present and the start and finish points are subsequently searched by adapting the threshold value and connected respectively to for a Cell Area. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008058124(A) 申请公布日期 2008.03.13
申请号 JP20060234832 申请日期 2006.08.31
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KIN EISHUN
分类号 G01N21/956;G01B11/24;G01B11/30;H01L21/66 主分类号 G01N21/956
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