发明名称 NONDESTRUCTIVE INSPECTION DEVICE AND METHOD BY ELECTROMAGNETIC WAVE
摘要 PROBLEM TO BE SOLVED: To allow an electromagnetic wave to effectively enter an inside of an inspection object, even when a clearance exists between a mobile inspection device main body and the inspection object, in nondestructive inspection by the electromagnetic wave. SOLUTION: The inspection device has: the inspection device main body 1 moving on a surface of the inspection object 6; an electromagnetic wave irradiation means 2 mounted on the inspection device main body 1, and for emitting the electromagnetic wave toward the inspection object 6; a wave reception means 3 mounted on the inspection device main body 1, and for acquiring a reflected wave signal of the electromagnetic wave emitted from the electromagnetic wave irradiation means 2; and a signal processing means 4 for detecting a defect of the inspection object 6 by signal-processing the reflected wave signal acquired by the wave reception means 3. The inspection device main body 1 has an electromagnetic coupling means 10 having a high dielectric constant higher than that of air, at least between the electromagnetic wave irradiation means 2 and the surface of the inspection object 6 so as to restrain electromagnetic reflection on the surface of the inspection object 6. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008058292(A) 申请公布日期 2008.03.13
申请号 JP20060307008 申请日期 2006.11.13
申请人 YAMAGUCHI UNIV 发明人 TANAKA SHOGO
分类号 G01N22/00;G01N33/38 主分类号 G01N22/00
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