发明名称 PLASMA TREATMENT DEVICE AND PLASMA TREATMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a compact and inexpensive plasma treatment device capable of efficiently performing etching to a workpiece, and to provide a plasma treatment method capable of efficiently performing etching. SOLUTION: The plasma treatment device 1 using atmospheric pressure (ordinary pressure) plasma comprises: a treatment chamber 2; a supporting means 3 provided in the treatment chamber 2 and supporting a substrate (workpiece) 10; a plasma feeding means 4 for introducing a treatment gas into flame F, so as to convert the treatment gas (etching gas) into plasma, and feeding the plasma toward the substrate 10; and an exhausting means 5 for exhausting the inside of the treatment chamber 2. In the plasma treatment chamber 1, activated atoms (radicals) in the plasma fed toward the substrate 10 are reacted with the substrate 10, and, by releasing the reactant from the substrate 10, etching can be performed to the substrate 10. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008057012(A) 申请公布日期 2008.03.13
申请号 JP20060236960 申请日期 2006.08.31
申请人 SEIKO EPSON CORP 发明人 SATO MITSURU
分类号 C23F4/04 主分类号 C23F4/04
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