发明名称 DEVICE TEST AND DEBUG USING POWER AND GROUND TERMINALS
摘要 The present disclosure describes a novel method and apparatus for using a device's power and ground terminals as a test and/or debug interface for the device. According to the present disclosure, messages are modulated over DC voltages applied to the power terminals of a device to input test/debug messages to the device and output test/debug messages from the device. The present disclosure advantageously allows a device to be tested and/or debugged without the device having any shared or dedicated test or debug interface terminals.
申请公布号 US2008065934(A1) 申请公布日期 2008.03.13
申请号 US20070854327 申请日期 2007.09.12
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WHETSEL LEE D.
分类号 G06F11/263 主分类号 G06F11/263
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