Non-metallic layered material i.e. silicon plate, defect detecting method for use during production of e.g. silicon solar cell, involves supplying layered material with heat flow for executing thermographical detection of defect

摘要

The method involves providing different types of patterns resulting from infrared technology, and providing a heat flow in transmission and/or in reflection in a temporal and/or local area. A non-metallic layered material (1) is supplied with heat flow for executing thermal detection of a defect (4), where a conductive material layer (2) is applied on one side of the non-metallic layered material, and is in thermal contact with the layered material. The layer is heated by an electromagnetic coupling. The layered material is heated with impulses, which are shorter than the exposure time. An independent claim is also included for a device for detecting a defect in a non-metallic layered material.