| 摘要 |
PROBLEM TO BE SOLVED: To enable to positively return to a usual status by releasing a test status after a test circuit becomes in the test status. SOLUTION: When a predetermined time elapses after the test circuit 5 is brought into the test status from the usual status or when a predetermined time elapses after an overcharge detecting means 10 detects a detecting signal in the test status, a delay circuit 8 returns a delay time from the test status to the usual status. Thus, even if the circuit is wrongly brought into the test status from the usual status, the wrong test status can be released and the circuit can positively return to the usual status. COPYRIGHT: (C)2008,JPO&INPIT
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