发明名称 LOW TEMPERATURE DEPOSITION OF PHASE CHANGE MEMORY MATERIALS
摘要 A system and method for forming a phase change memory material on a substrate, in which the substrate is contacted with precursors for a phase change memory chalcogenide alloy under conditions producing deposition of the chalcogenide alloy on the substrate, at temperature below 350°C, with the contacting being carried out via chemical vapor deposition or atomic layer deposition. Various tellurium, germanium and germanium-tellurium precursors are described, which are useful for forming GST phase change memory films on substrates.
申请公布号 WO2007133837(A3) 申请公布日期 2008.03.13
申请号 WO2007US63832 申请日期 2007.03.12
申请人 ADVANCED TECHNOLOGY MATERIALS, INC.;ROEDER, JEFFREY, F.;BAUM, THOMAS, H.;HENDRIX, BRYAN, C.;STAUF, GREGORY, T.;XU, CHONGYING;HUNKS, WILLIAM;CHEN, TIANNIU;STENDER, MATTHIAS 发明人 ROEDER, JEFFREY, F.;BAUM, THOMAS, H.;HENDRIX, BRYAN, C.;STAUF, GREGORY, T.;XU, CHONGYING;HUNKS, WILLIAM;CHEN, TIANNIU;STENDER, MATTHIAS
分类号 G11C11/00 主分类号 G11C11/00
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