发明名称 |
PLASMA GENERATING APPARATUS AND PLASMA GENERATING METHOD |
摘要 |
An apparatus and a method for generating plasma are provided to enhance an etch selectivity by supplying electrons having high temperatures to a main plasma generating space. An apparatus includes a chamber(1) having a plasma generating space. A lower electrode(3) is positioned within the chamber, and has a table for supporting a semiconductor substrate. An upper electrode(2) is positioned to face the lower electrode, and is disposed within the chamber to constitute a first plasma generating source together with the lower electrode. A second plasma generating source is positioned at a higher location than that of a lower surface of the upper electrode, and is disposed at an outer circumference of the upper electrode. A power supply supplies a power to the first and second plasma generating sources.
|
申请公布号 |
KR20080023061(A) |
申请公布日期 |
2008.03.12 |
申请号 |
KR20060087064 |
申请日期 |
2006.09.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
USHAKOV ANDREY;YURI TOLMACHEV;VLADIMIR VOLYNETS;PAK, WON CEAK;VASILY PASHKOVSKIY;PARK, SUNG CHAN;LEE, YUNG HEE |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|