发明名称 PLASMA GENERATING APPARATUS AND PLASMA GENERATING METHOD
摘要 An apparatus and a method for generating plasma are provided to enhance an etch selectivity by supplying electrons having high temperatures to a main plasma generating space. An apparatus includes a chamber(1) having a plasma generating space. A lower electrode(3) is positioned within the chamber, and has a table for supporting a semiconductor substrate. An upper electrode(2) is positioned to face the lower electrode, and is disposed within the chamber to constitute a first plasma generating source together with the lower electrode. A second plasma generating source is positioned at a higher location than that of a lower surface of the upper electrode, and is disposed at an outer circumference of the upper electrode. A power supply supplies a power to the first and second plasma generating sources.
申请公布号 KR20080023061(A) 申请公布日期 2008.03.12
申请号 KR20060087064 申请日期 2006.09.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 USHAKOV ANDREY;YURI TOLMACHEV;VLADIMIR VOLYNETS;PAK, WON CEAK;VASILY PASHKOVSKIY;PARK, SUNG CHAN;LEE, YUNG HEE
分类号 H01L21/3065 主分类号 H01L21/3065
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