发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device manufacturing method comprises the steps of forming a metal film ( 24 ) on an organic interlayer insulating film ( 22 ) formed over a semiconductor substrate to get a metal diffusion preventing metal carbide film ( 23 ) on a boundary between the organic interlayer insulating film ( 22 ) and the metal film ( 24 ), and leaving the metal carbide film ( 23 ) on the organic interlayer insulating film ( 22 ) by removing selectively the metal film ( 24 ) from the metal carbide film ( 23 ).
申请公布号 US7341936(B2) 申请公布日期 2008.03.11
申请号 US20040011113 申请日期 2004.12.15
申请人 FUJITSU LIMITED 发明人 KIMURA TAKAHIRO;UCHIBORI CHIHIRO
分类号 H01L21/283;H01L21/4763;H01L21/768 主分类号 H01L21/283
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