发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A semiconductor device manufacturing method comprises the steps of forming a metal film ( 24 ) on an organic interlayer insulating film ( 22 ) formed over a semiconductor substrate to get a metal diffusion preventing metal carbide film ( 23 ) on a boundary between the organic interlayer insulating film ( 22 ) and the metal film ( 24 ), and leaving the metal carbide film ( 23 ) on the organic interlayer insulating film ( 22 ) by removing selectively the metal film ( 24 ) from the metal carbide film ( 23 ).
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申请公布号 |
US7341936(B2) |
申请公布日期 |
2008.03.11 |
申请号 |
US20040011113 |
申请日期 |
2004.12.15 |
申请人 |
FUJITSU LIMITED |
发明人 |
KIMURA TAKAHIRO;UCHIBORI CHIHIRO |
分类号 |
H01L21/283;H01L21/4763;H01L21/768 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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