发明名称 Self-aligned nanometer-level transistor defined without lithography
摘要 A field effect transistor (FET) device structure and method for forming FETs for scaled semiconductor devices. Specifically, FinFET devices are fabricated from silicon-on-insulator (SOI) wafers in a highly uniform and reproducible manner. The method facilitates formation of FinFET devices with improved and reproducible fin height control while providing isolation between source and drain regions of the FinFET device.
申请公布号 US7341916(B2) 申请公布日期 2008.03.11
申请号 US20050271094 申请日期 2005.11.10
申请人 ATMEL CORPORATION 发明人 LOJEK BOHUMIL
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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