发明名称 DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A display apparatus and a manufacturing method thereof are provided to reduce leakage current from a polycrystalline silicon electrode with a simple structure to exhibit stable storage characteristics. A polycrystalline silicon electrode(18) is formed on an insulating substrate(11), and a gate insulating film(16) is formed on the polycrystalline silicon electrode. A gate metal electrode(17) is formed on the gate insulating film at a position opposite to the polycrystalline silicon electrode. The gate metal electrode partly or entirely covers an edge of the polycrystalline silicon electrode when viewed from a top. Provided that a distance from an edge of the polycrystalline silicon electrode to an edge of the gate metal electrode is Y, a film thickness of the polycrystalline silicon electrode is a, a film thickness of the gate insulating film is b, and a film thickness of the gate metal electrode is c, c is larger than a and b.</p>
申请公布号 KR20080021517(A) 申请公布日期 2008.03.07
申请号 KR20070085931 申请日期 2007.08.27
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 IMAMURA TAKUJI
分类号 H01L29/786 主分类号 H01L29/786
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