发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having an electrode that is appropriately connected to both of p-type and n-type group III-V nitride semiconductor layers. SOLUTION: In the field effect transistor, a nitride semiconductor lamination structure section 2 is arranged on a sapphire substrate 41. The nitride semiconductor lamination structure section 2 comprises: an n-type GaN layer 5; a p-type GaN layer 6; and an n-type GaN layer 7. A trench 16 having a V-shaped section is formed at the nitride compound semiconductor lamination structure section 2, a gate insulation film is formed on a wall surface 17 in the trench 16, and further a gate electrode 20 is formed so that it opposes the wall surface 17 while sandwiching the gate insulation film 19. A source electrode 25 is composed by joining a first electrode section 251 in ohmic contact with the p-type GaN layer 6 and a second electrode section 252 in ohmic contact with the n-type GaN layer 7. The first electrode section 251 and the second electrode section 252 are made of different metal materials. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008053449(A) 申请公布日期 2008.03.06
申请号 JP20060228029 申请日期 2006.08.24
申请人 ROHM CO LTD 发明人 OTA HIROAKI;TAKASU HIDESHI
分类号 H01L21/28;H01L21/336;H01L29/12;H01L29/78;H01L29/786 主分类号 H01L21/28
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