发明名称 SUBSTRATE INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To make a substrate inspection device compact and to install the substrate inspection device in a smaller space even in the case where a plurality of the substrate inspection devices are used. SOLUTION: The substrate inspection device 1 has an integrated constitution that a substrate holding mechanism for holding a printed circuit board P to move the same, an imaging mechanism for imaging the substrate P, a controller 63 for judging quality from image data, a liquid crystal display panel 4 for displaying an inspection result, etc. are incorporated in a base from 10 and covered with a casing Ca from outside. Further, the inlet and outlet port 6 of the substrate P and the inspection part (the imaging position of the substrate P due to an imaging unit 50) of the substrate P are arranged in front and rear directions and a liquid crystal display panel 4 is arranged to the almost intermediate part between the inlet and outlet port 6 and an inspection position so as to be directed to the front side of the substrate inspection device. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008051754(A) 申请公布日期 2008.03.06
申请号 JP20060230561 申请日期 2006.08.28
申请人 I-PULSE CO LTD 发明人 TSUNODA YOSHIHISA
分类号 G01N21/956 主分类号 G01N21/956
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