发明名称 Composite stressors in MOS devices
摘要 A semiconductor device includes a semiconductor substrate, a gate stack on the semiconductor substrate, and a stressor adjacent the gate stack and having at least a portion in the semiconductor substrate, wherein the stressor comprises an element for adjusting a lattice constant of the stressor. The stressor includes a lower portion and a higher portion on the lower portion, wherein the element in the lower portion has a first atomic percentage, and the element in the higher portion has a second atomic percentage substantially greater than the first atomic percentage.
申请公布号 US2008054347(A1) 申请公布日期 2008.03.06
申请号 US20060516265 申请日期 2006.09.06
申请人 WANG YIN-PIN 发明人 WANG YIN-PIN
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
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