发明名称 |
LASER ALIGNMENT MONITORING FUSE STRUCTURE AND SEMICONDUCTOR DEVICE HAVING THE SAME AND LASER ALIGNMENT MONITORING CIRCUIT |
摘要 |
<p>A laser alignment monitoring fuse structure, a semiconductor device having the same, and a laser alignment monitoring circuit are provided to prevent cutting defects and a pitch decrease of a fuse arranged in a fuse box by arranging a monitoring fuse in a signature fuse box. A memory cell block(61) has a plurality of memory cells. A redundancy memory cell block(62) has a multiplicity of memory cells. Plural input pads provide address signals and command signals to the memory cell block and the redundancy memory cell block. A fuse box(63) has a plurality of first fuses having a first width and being cut by a laser, thereby repairing memory cells having defects with the memory cells of the redundancy memory cell block. A signature fuse box(64) has plural second fuses and stores information of a semiconductor device according to a cutting of the second fuses. A monitoring fuse is arranged on the signature box for monitoring an alignment of the laser for cutting the first fuse in the fuse box.</p> |
申请公布号 |
KR100809708(B1) |
申请公布日期 |
2008.03.06 |
申请号 |
KR20060101025 |
申请日期 |
2006.10.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JAE YOUNG;PARK, JOO SUNG |
分类号 |
H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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