发明名称 LASER ALIGNMENT MONITORING FUSE STRUCTURE AND SEMICONDUCTOR DEVICE HAVING THE SAME AND LASER ALIGNMENT MONITORING CIRCUIT
摘要 <p>A laser alignment monitoring fuse structure, a semiconductor device having the same, and a laser alignment monitoring circuit are provided to prevent cutting defects and a pitch decrease of a fuse arranged in a fuse box by arranging a monitoring fuse in a signature fuse box. A memory cell block(61) has a plurality of memory cells. A redundancy memory cell block(62) has a multiplicity of memory cells. Plural input pads provide address signals and command signals to the memory cell block and the redundancy memory cell block. A fuse box(63) has a plurality of first fuses having a first width and being cut by a laser, thereby repairing memory cells having defects with the memory cells of the redundancy memory cell block. A signature fuse box(64) has plural second fuses and stores information of a semiconductor device according to a cutting of the second fuses. A monitoring fuse is arranged on the signature box for monitoring an alignment of the laser for cutting the first fuse in the fuse box.</p>
申请公布号 KR100809708(B1) 申请公布日期 2008.03.06
申请号 KR20060101025 申请日期 2006.10.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JAE YOUNG;PARK, JOO SUNG
分类号 H01L21/82 主分类号 H01L21/82
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