发明名称 WORD LINE CONTROL METHOD TO IMPROVE READ MARGIN AND WRITE MARGIN FOR EMBEDDED MEMORIES
摘要 Apparatus to apply a voltage to the word line during a first time interval portion of the access cycle and to apply a further voltage to the word line during a further time interval portion of the access cycle and to apply the further voltage to a further word line during the first time interval portion of the access cycle and to apply the voltage to the further word line during the further time interval of the access cycle.
申请公布号 US2008056053(A1) 申请公布日期 2008.03.06
申请号 US20060468877 申请日期 2006.08.31
申请人 RAO SETTI SHANMUKHESWARA;SAHOO BISWA BHUSAN 发明人 RAO SETTI SHANMUKHESWARA;SAHOO BISWA BHUSAN
分类号 G11C8/00 主分类号 G11C8/00
代理机构 代理人
主权项
地址