| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device mounted with an ECC system which can correct 3-bit errors. <P>SOLUTION: An error detection and correction system, which detects positions of errors of read data by making use of BCH codes and corrects them, is mounted on the semiconductor storage device. The error detection and correction system has a 3EC system which can correct 3-bit errors. The 3EC system subjects a cubic error position searching equation to variable transformation with the introduction of two or more parameters, separates parts of only unknown value and parts computed by syndromes, and compares indexes of candidates of solutions, which are preliminarily found as a table, with the indexes of the syndromes to find error positions. <P>COPYRIGHT: (C)2008,JPO&INPIT |
