发明名称 WAFER PROTECTION SYSTEM EMPLOYED IN CHEMICAL STATIONS
摘要 Semiconductor wafers have ashed photoresist residue and/or post-etch residue thereon to be cleaned through the chemical wet station, and a pattern of exposed metal layer. Post-etch residue removing solvent such as EKC-270 is fed into the solvent tank through a first solvent valve and first liquid feeding conduit that connected to bottom of the solvent tank. A circulation conduit connects the solvent tank with the first liquid feeding conduit for circulating the post-etch residue removing solvent. A liquid feeding pump is connected with the first liquid feeding conduit. A liquid drain conduit and a drain valve are connected with bottom of the solvent tank. Replacement solvent such as EKC-800 is fed into the solvent tank through a second solvent valve and second liquid feeding conduit.
申请公布号 US2008053491(A1) 申请公布日期 2008.03.06
申请号 US20070930137 申请日期 2007.10.31
申请人 CHEN SAN-LUNG;CHEN YING-FANG;CHU KUO-ZHANG;TSENG MEI-LUN 发明人 CHEN SAN-LUNG;CHEN YING-FANG;CHU KUO-ZHANG;TSENG MEI-LUN
分类号 B08B3/06 主分类号 B08B3/06
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