发明名称 JIG, FILM THICKNESS MEASURING DEVICE AND METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To measure the film thickness of a messenger wire in a simple and accurate manner. SOLUTION: The film thickness measuring device 4 has a holding section 28 that holds a messenger wire 1; an insertion port 25a into which the probe 8 of an electromagnetic film thickness meter 5 is inserted; and a jig 6, including a guiding section 25 that guides a detecting section 10a of the probe 8 toward the surface 2a of an element wire 2. The device maintains a state where the detecting section 10a of the probe 8 inserted from the insertion port 25a is made to face the surface 2a, and contact the detecting section 10a to the face 2a or galvanization part 3 vertically, wherein a subtraction result obtained by subtracting a second measurement value from a first measurement value is compensated, based on a calibration data 18a, derived from correlation between a plurality of film thickness values and a subtraction result, obtained by subtracting the second measurement value from each measurement value that has been obtained, by measuring a plurality of elements 2 that are coated with plastic films, consisting of the plurality of film thickness values by using the electromagnetic meter 5. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008051734(A) 申请公布日期 2008.03.06
申请号 JP20060230240 申请日期 2006.08.28
申请人 CENTRAL RES INST OF ELECTRIC POWER IND 发明人 MATSUURA SHINICHI;OZAKI AKIO
分类号 G01B7/06 主分类号 G01B7/06
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