发明名称 Semiconductor memory device
摘要 A semiconductor memory device includes a delay locked loop for correcting a duty cycle rate of a delay locked clock signal. The semiconductor memory device includes a delay locked circuit, a duty cycle correction circuit, and a clock synchronization circuit. The delay locked circuit outputs a delay locked clock by delaying a system clock by a predetermined time. The duty cycle correction circuit outputs a first clock by correcting a duty cycle of the delay locked clock, wherein the proportion of high to low level periods of the delay locked clock is controlled according to a time difference between a second edge of the first clock and that of a second clock derived from the first clock. The clock synchronization circuit synchronizes a first edge of the first clock with that of the second clock.
申请公布号 US2008054964(A1) 申请公布日期 2008.03.06
申请号 US20070819783 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE HYUN-WOO;YUN WON-JOO
分类号 G11C8/00;H03L7/06 主分类号 G11C8/00
代理机构 代理人
主权项
地址