| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve such a problem that a semiconductor laser sometimes includes an initial failure mode that does not depend on temperature and develops as the quantity of optical power in the inside, namely the quantity of externally observed optical output becomes larger, the developing initial failure mode as the quantity of optical output increases is insufficiently screened, and the initial failure rate is slightly higher than that of a semiconductor laser with the conventional active layer material. <P>SOLUTION: It is effective in a manufacturing step to adopt a test using large optical output at lower temperature than an average operating temperature such as room temperature. Thus, an element having an initial failure mode that develops as the quantity of optical output increases is eliminated, and expected service life is prolonged. <P>COPYRIGHT: (C)2008,JPO&INPIT |
