发明名称 |
METHOD OF DETERMINING MEMORY STATE OF RESISTIVE MEMORY CELL AND DEVICE MEASURING MEMORY STATE OF RESISTIVE MEMORY CELL |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To determine the memory state of a resistive memory cell including a first electrode, a second electrode and an active material being arranged between the first electrode and the second electrode. <P>SOLUTION: A read capacity of the memory cell is charged or discharged by applying a voltage between the first electrode and the second electrode. The memory state of the memory cell is determined in accordance with a change of the voltage between the first electrode and the second electrode at the charge or discharge of the read capacity. The determination of the memory state includes a sampling operation of the voltage of the second electrode, and a corresponding voltage sampling value is compared with at least one reference voltage. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
申请公布号 |
JP2008052896(A) |
申请公布日期 |
2008.03.06 |
申请号 |
JP20070214428 |
申请日期 |
2007.08.21 |
申请人 |
QIMONDA AG |
发明人 |
LIAW CORVIN;ANGERBAUER MICHAEL;HOENIGSCHMID HEINZ |
分类号 |
G11C13/00;H01L27/10;H01L45/00;H01L49/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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