发明名称 METHOD OF DETERMINING MEMORY STATE OF RESISTIVE MEMORY CELL AND DEVICE MEASURING MEMORY STATE OF RESISTIVE MEMORY CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To determine the memory state of a resistive memory cell including a first electrode, a second electrode and an active material being arranged between the first electrode and the second electrode. <P>SOLUTION: A read capacity of the memory cell is charged or discharged by applying a voltage between the first electrode and the second electrode. The memory state of the memory cell is determined in accordance with a change of the voltage between the first electrode and the second electrode at the charge or discharge of the read capacity. The determination of the memory state includes a sampling operation of the voltage of the second electrode, and a corresponding voltage sampling value is compared with at least one reference voltage. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008052896(A) 申请公布日期 2008.03.06
申请号 JP20070214428 申请日期 2007.08.21
申请人 QIMONDA AG 发明人 LIAW CORVIN;ANGERBAUER MICHAEL;HOENIGSCHMID HEINZ
分类号 G11C13/00;H01L27/10;H01L45/00;H01L49/00 主分类号 G11C13/00
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