发明名称 Memory device having function of detecting bit line sense amp mismatch
摘要 Provided is a memory device that can detect a mismatch in a bit line sense amp, wherein the memory device includes a sense amp drive unit for selectively supplying a pull-up drive voltage or a pull-down drive voltage to a bit line sense amp in response to a sensing test signal provided from outside.
申请公布号 US2008056040(A1) 申请公布日期 2008.03.06
申请号 US20060647631 申请日期 2006.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 IM JAE-HYUK;DO CHANG-HO
分类号 G11C7/02 主分类号 G11C7/02
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