发明名称 SAMPLING CIRCUIT AND TESTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve the problem, wherein in a conventional sampling circuit impedance mismatching in a high-frequency range occurs at a part from a terminal resistor to the output end of the sampling circuit, and frequency characteristics deteriorate. SOLUTION: The sampling circuit comprises a pulse generating section which generates a positive pulse signal and a negative pulse signal and outputs them from a positive pulse output terminal and a negative pulse output terminal; a positive transmission line, connecting the positive pulse output terminal and the ground; a negative transmission line connecting the negative pulse output terminal and the ground; a sampling section which is connected between the positive transmission line and the negative transmission line and samples a signal input to a sampling input terminal, with a timing at which the positive pulse signal and the negative pulse signal are input from the positive transmission line and the negative transmission line; an observed signal transmission line, connecting an observed signal input terminal to which an observed signal is input and the sampling input terminal via a series terminal resistor; and a parallel terminal section having a parallel terminal resistor connected between the sampling input terminal and at least one of the positive transmission line, and the negative transmission line. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008051582(A) 申请公布日期 2008.03.06
申请号 JP20060226220 申请日期 2006.08.23
申请人 ADVANTEST CORP 发明人 KAWABATA MASAYUKI;KONNO TAKESHI
分类号 G01R31/319 主分类号 G01R31/319
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