| 发明名称 |
TFT ARRAY SUBSTRATE, INSPECTION METHOD FOR SAME, AND DISPLAY DEVICE |
| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a TFT array substrate in which a pixel circuit can be inspected with high sensitivity and an inspection time can be shortened, and to provide an inspection method for the substrate and a display device. <P>SOLUTION: The TFT array substrate includes a TFT for inspection either the source or the drain of which is electrically connected to the drain of a driving TFT and the other of which is electrically connected to a signal line in the adjoining column, wherein the output current of the driving TFT is inspected via the signal line in the adjoining column. During the inspection, the potential of the signal line functioning as a passage of an inspection current is fixed, while the gate of the TFT for inspection is connected to a scanning line in the next row. <P>COPYRIGHT: (C)2008,JPO&INPIT |
| 申请公布号 |
JP2008052111(A) |
申请公布日期 |
2008.03.06 |
| 申请号 |
JP20060229247 |
申请日期 |
2006.08.25 |
| 申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
AGARI MASASHI;HASHIDO RYUICHI;GOTO SUEHIRO;TOKIOKA HIDETADA;NAKAGAWA NAOKI |
| 分类号 |
G09F9/30;G09F9/00;G09G3/20;G09G3/30;H01L27/32;H01L51/50;H05B33/12 |
主分类号 |
G09F9/30 |
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