发明名称 SUPERCRITICAL FLUID CLEANING OF SEMICONDUCTOR SUBSTRATES
摘要 Chemical formulations and methods for removing unwanted material, such as unexposed photoresist, metal oxides, CMP residue, and the like, from semiconductor wafers or other substrates. The formulations utilize a supercritical fluid-based cleaning composition, which may further include (I) co-solvent(s), (II) surfactant(s), (III) chelating agent(s), and/or (IV) chemical reactant(s).
申请公布号 US2008058238(A1) 申请公布日期 2008.03.06
申请号 US20070869301 申请日期 2007.10.09
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 XU CHONGYING;MINSEK DAVID W.;ROEDER JEFFREY F.;KORZENSKI MICHAEL B.;HEALY MATTHEW;BAUM THOMAS H.
分类号 C11D7/50;B08B7/00;C11D3/02;C11D3/43;C11D7/02;C11D11/00;G03F7/40;G03F7/42 主分类号 C11D7/50
代理机构 代理人
主权项
地址