发明名称 LOW LEAKAGE MIM CAPACITOR
摘要 Capacitor structures for use in integrated circuits and methods of their manufacture. The capacitor structures include a bottom electrode, a top electrode and a dielectric layer interposed between the bottom electrode and the top electrode. The capacitor structures further include a metal oxide buffer layer interposed between the dielectric layer and at least one of the bottom and top electrodes. Each metal oxide buffer layer acts to improve capacitance and reduce capacitor leakage. The capacitors are suited for use as memory cells and apparatus incorporating such memory cells, as well as other integrated circuits.
申请公布号 US2008057663(A1) 申请公布日期 2008.03.06
申请号 US20070932512 申请日期 2007.10.31
申请人 MICRON TECHNOLOGY, INC. 发明人 YANG SAM
分类号 H01L21/20;H01L21/02;H01L21/768;H01L21/8242 主分类号 H01L21/20
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