发明名称 Ion trap mass spectrometry method
摘要 According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass spectrometer, the mass spectrometer including: an ion source part for ionizing a sample; an ion trap part for trapping ions generated in the ion source; a main high frequency power source for applying a main high frequency voltage to the ion trap part, and an auxiliary high frequency power source for applying an auxiliary high frequency voltage thereto; and a detector for detecting the ions ejected from the ion trap. The ion trap mass spectrometry method and the ion trap mass spectrometry device includes the steps of: accumulating desired ions into the ion trap part by ejecting undesired ions while accumulating ions into the ion trap part; and ejecting undesired ions that remain in the ion trap part and leaving the desired ions in the ion trap part are repeated alternately.
申请公布号 US2008054173(A1) 申请公布日期 2008.03.06
申请号 US20070889232 申请日期 2007.08.10
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 YASUDA HIROYUKI;NAGAI SHINJI;NISHIDA TETSUYA
分类号 H01J49/04 主分类号 H01J49/04
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