TEST SUPPORT METHOD OF TEST HANDLER AND TEST HANDLER

摘要

A test support method of a test handler and the test handler are provided to increase an operating ratio of a tester and to shorten the test time of plural lots by classifying semiconductor devices of front and rear lots during an unloading process, even if the semiconductor devices of different lots are loaded in a test tray together. A test support method of a test handler is composed of a loading step for loading semiconductor devices to a test tray at a loading position(S401); a test support step for testing the semiconductor devices stacked in the test tray, by a tester when the test tray completely loading the semiconductor devices moves to a test position(S402); and an unloading step for unloading the semiconductor devices from the test tray to customer trays if the test tray storing the completely tested semiconductor devices is transferred to an unloading position. The unloading step comprises the steps for photographing the semiconductor devices by a camera in unloading the semiconductor devices from the test tray to the customer trays(S404); reading lot discriminating signs of the semiconductor devices(S405); and classifying the semiconductor devices on the basis of the read information and then moving and loading the classified semiconductor devices in the customer trays(S406).