| 摘要 |
<p>The method involves decorticating a log (1) partly. The progression of the longitudinal scratches (5) deviating in all cases parallel to the longitudinal axis (X) of the log in a barked region is determined. The progression of the longitudinal ridges is determined optically relative to the longitudinal axis of the log. An independent claim is also included for a sawmill device has a device for determining quality of a log.</p> |
